Relevant publications (3 max.) |
Vázsonyi, É., Szilágyi, E., Petrik, P., Horváth, Z.E., Lohner, T., Fried, M. and Jalsovszky, G., 2001. Porous silicon formation by stain etching. Thin Solid Films, 388(1-2), pp.295-302. |
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Fried, M., Lohner, T., Polgár, O., Petrik, P., Vazsonyi, E., Bársony, I., Piel, J.P. and Stehle, J.L., 1996. Characterization of different porous silicon structures by spectroscopic ellipsometry. Thin Solid Films, 276(1-2), pp.223-227. |
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Petrik, P., Fried, M., Vazsonyi, E., Basa, P., Lohner, T., Kozma, P. and Makkai, Z., 2009. Nanocrystal characterization by ellipsometry in porous silicon using model dielectric function. Journal of Applied Physics, 105(2), p.024908. |
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