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Update Data 
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petrik.peter@ek.hun-ren.hu |
| Last update: 22/10/2025 | |
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| Name: |
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Institution: |
HUN-REN EK |
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Type of Institution: |
Research Center |
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ORCID number: |
https://orcid.org/0000-0002-5374-6952
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Google Scholar: |
https://scholar.google.com/citations?user=c5iJcmwAAAAJ&hl=en
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Research Gate: |
https://www.researchgate.net/#:~:text=Home,-Questi
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Country: |
Hungary
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WEB address: |
https://petrik.ellipsometry.hu/ |
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Working groups of interest |
| - | WG1 - Advances in Porous Materials and Technologies | | - | WG2 - Health | | - | WG3 - Energy | | - | WG4 - Environment |
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| Keywords |
| - | | Energy | | - | | Environment | | - | | Health | | - | | Macropores | | - | | Mesopores | | - | | Nanopores | | - | | Oxides | | - | | Porous Semiconductors | | - | | Smart Functional Surfaces | | - | | Technology |
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Research field (Free keywords) |
Ellipsometry |
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| Materials/technologies |
| - | | Porous Silicon | | - | | Inorganic Porous Materials (Porous Alumina, TiO2, ZnO) | | - | | Aerogels |
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Scientific expertise |
Development of metrology |
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Relevant publications
(6 max.) |
| Petrik, P. et al. Ellipsometric characterization of nanocrystals in porous silicon. APPL SURF SCI 253, 200–203 (2006). |
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| Vázsonyi, É. et al. Porous silicon formation by stain etching. Thin Solid Films 388, 295–302 (2001). |
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| Agocs, E. et al. Optical characterization of nanocrystals in silicon rich oxide superlattices and porous silicon. Thin Solid Films 519, 3002–3005 (2011). |
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| Fodor, B. et al. Porosity and thickness characterization of porous Si and oxidized porous Si layers – an ultraviolet-visible-mid infrared ellipsometry study. MICROPOR MESOPOR MAT 227, 112–120 (2016). |
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